MightyProber

IWSS-Mapping Systemt

IWSS Intelligent Wafer Sorting System - Seamless Upgrade and Wafer Mapping Process Optimization Solution for AI RWM Customers

IWSS Contro Mapping Systemt

The Intelligent Wafer Sort System, IWSS, was designed to be the cost effective, easy to
implement upgrade for all AI RWM customers. The menu structure and terminology used in this comprehensive mapping package was specifically designed to allow for a simple, smooth transition from the AI RWM package into the IWSS package. From our intuitive menu structure and ease of use, to our process improvement tools and utilities, you will see that the IWSS package delivers unparalleled performance and value to your probing process, with minimal process disruption.

Capability

  • Full automatic run
  • Full and Sampling probing
  • Muti-die test
  • Repobing and Inking(Bin code/Fail die)
  • Real-time display testing
  • information(Count/Yield/Time ..etc)
  • Probing and Inker counter
  • Testing verification(Yield limit/Consecutive
  • fail..etc)
  • Probe clean
  • Pre-heating
  • OCR

Advantage

  • Software protection by dongle
  • Software upgrade capability
  • Robust industrial database(SQL Server)
  • Windows compatibility(Win NT/2K/XP/7)
  • Some options for customization
  • Easy setup, operation and recovery
  • Support all communicated interfaces for tester and
  • prober(TTL/RS232/GPIB)
  • Most model probers compatibility(EG/TSK/TEL..etc)

Special Application

  • Upload and Download product recipes(Only support EG now)
  • Auto-mapping by CCD scanning the wafer
  • Control map creation from importing tester map
  • Smart sampling test
  • Micro testing for muti-devices on a wafer
  • Composite wafer map for sorting tested wafers
  • Calculate life time of every probe card
  • Record defects into the system after wafer inspection
  • Command terminal for all communicated interface

Options